- Facilities at CRL
- Transmission Electron Microscope (TEM) with EDX
- Scanning Electron Microscopes (SEM) with EDX
- X Ray Diffractometer (XRD)
- Energy Dispersive X Ray Fluorescence Spectroscopy
- Universal Testing Machine (UTM)
- Gas Chromatography (GC)
- Gas Chromatography Mass Spectroscopy (GC MS)
- High Performance Liquid Chromatography (HPLC)
- Preparative HPLC
- Atomic Absorption Spectrometer (AAS)
- Flame Photometer
- Dynamic Mechanical Analyzer (DMA)
- Surface Area and Pore Size Analyzer (SAA)
- Simultaneous Thermal Analyzer (STA)
- Bomb Calorimeter
- Zeta Sizer
- Fluorescent Spectrophotometer
- Ultraviolet Near Infrared Spectrometer
- Ultraviolet Visible Spectrometer
- Fourier Transform Infrared Spectrometer
- High Speed Centrifuge
- Liquid Nitrogen Plant (LN2 Plant)
- TEM Sample Preparation Units
- High Temperature Furnaces
- Coating Units
- Viscometery
- Accessories
Centralized Resource Laboratory
Ultraviolet Visible Diffused Reflectance Spectrometer
Specification:
Model:
Make: Perkin Elmer, USA
Analysis Requirements:
The samples should be finely powdered solid.