- Facilities at CRL
- Transmission Electron Microscope (TEM) with EDX
- Scanning Electron Microscopes (SEM) with EDX
- Energy Dispersive X Ray Fluorescence Spectroscopy
- Universal Testing Machine (UTM)
- Gas Chromatography (GC)
- Gas Chromatography Mass Spectroscopy (GC MS)
- High Performance Liquid Chromatography (HPLC)
- Preparative HPLC
- Atomic Absorption Spectrometer (AAS)
- Flame Photometer
- Dynamic Mechanical Analyzer (DMA)
- Surface Area and Pore Size Analyzer (SAA)
- Simultaneous Thermal Analyzer (STA)
- Bomb Calorimeter
- Zeta Sizer
- Fluorescent Spectrophotometer
- Ultraviolet Near Infrared Spectrometer
- Ultraviolet Visible Spectrometer
- Ultraviolet Visible Diffused Reflectance Spectrometer
- Fourier Transform Infrared Spectrometer
- High Speed Centrifuge
- Liquid Nitrogen Plant (LN2 Plant)
- TEM Sample Preparation Units
- High Temperature Furnaces
- Coating Units
- Viscometery
- Accessories
Centralized Resource Laboratory
X Ray Diffractometer (XRD)
Specifications:
Model: JDX-3532
Make: JEOL, Japan
Voltage: 20-40kV
Current: 2.5-30mA
X-Rays: CuKa (Wavelength = 1.5418Å)
2Theta-Range: 0 to 160°
Analysis Requirements:
The samples should be finely powdered and the minimum amount should be 50mg. In case of solid materials (ceramics/geological materials), the samples should be prepared by the users (cutting/polishing/grinding). The maximum size, in case of solid materials, should be less than 1 cm X 2 cm in area and 0.5 cm in thickness.